DocumentCode
657503
Title
Comparative analysis of Bayesian and classical approaches for software reliability measurement
Author
Wandji, T. Ketchiozo ; Sarkani, S. ; Eveleigh, Timothy ; Holzer, Thomas H. ; Keiller, Peter A.
Author_Institution
Dept. of Eng. Manage. & Syst. Eng., George Washington Univ., Washington, DC, USA
fYear
2013
fDate
4-7 Nov. 2013
Firstpage
9
Lastpage
10
Abstract
Software failure remains an important cause of reported system outage. Yet, developing reliable software is still not well understood by the programmer, the Software Engineer and the Program manager. Software reliability growth models (SRGMs) provide a framework to analyze software failures by using past failure data to predict the reliability of the software. Most models that have been used have limitations in predicting accurately. There is a need to conduct research aimed at improving the performance of these models. To accurately predict reliability, the model´s parameters should be estimated in such a way that the mathematical function of the model fits with the failure data. While the majority of previous software reliability studies have used classical methods to estimate model´s parameters, a few other studies have used a Bayesian approach. Bayesian approaches allow the incorporation of prior information into models and they have been claimed to be more successful than classical approaches in certain situations. Our research goal is to investigate if the use of Bayesian methods improves the predictability of SRGMs by conducting a direct comparative analysis of Bayesian and classical approaches for software reliability assessment.
Keywords
Bayes methods; software reliability; Bayesian approach; SRGM; software failure; software reliability growth model; software reliability measurement; Bayes methods; Data models; Mathematical model; Predictive models; Software; Software reliability; bayesian inference; classical inference; comparative analysis; software reliability measurement; software reliability models;
fLanguage
English
Publisher
ieee
Conference_Titel
Software Reliability Engineering Workshops (ISSREW), 2013 IEEE International Symposium on
Conference_Location
Pasadena, CA
Type
conf
DOI
10.1109/ISSREW.2013.6688851
Filename
6688851
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