Title :
International standardization of Open Systems Dependability
Author :
Takamura, Hiroki
Author_Institution :
Dependable Embedded OS R&D Center, Japan Sci. & Technol. Agency (JST), Tokyo, Japan
Abstract :
In this talk, we will explain our current status of international standardization activities in DEOS project.
Keywords :
open systems; software reliability; software standards; standardisation; DEOS project; international standardization; open systems dependability; IEC; IEC standards; Open systems; Presses; International Electrotechnical Commission (IEC); Open Systems Dependability; The Open Group (TOG); the DEOS process;
Conference_Titel :
Software Reliability Engineering Workshops (ISSREW), 2013 IEEE International Symposium on
Conference_Location :
Pasadena, CA
DOI :
10.1109/ISSREW.2013.6688863
