Research on electromagnetic compatibility testing indexes based on statistical process control

A method analyzing EMC testing indexes is proposed based on the Statistical Process Control. Adopting this method, we firstly collect testing data accumulated in engineering practice, then recur to the statistical analyze, paint control chart, evaluate the steady state of electromagnetism characteristic and assistant decision makings about testing parameters. Differencing from the conventional applications of Statistical Process Control, we needn´t discover the exceptional factors based on the feedback information or take corresponding measures to eliminate influence; Also based on the testing data analysis, this method avoids large amount of modeling and simulating numeration and is simple and convenient, which will be a great favor in complex circumstance where it is difficult or impossible to establish simulating models. To illustrate how this method be carried out in practice, we analyze the super scales of a typical electromagnetic emission item step by step, and give some advices based on the results at last.