Title :
Tutorials [2 abstracts]
Author :
Singh, Adit D. ; Chakrabarty, Krishnendu
Author_Institution :
Dept. of Electr. & Comput. Eng., Auburn Univ., Auburn, AL, USA
Abstract :
These tutorials discuss the following: Statistical Adaptive Test Methods Targeting “Zero Defect” IC Quality and Reliability; and Testing TSV-Based 3D Stacked ICs.
Keywords :
integrated circuit reliability; integrated circuit testing; 3D stacked IC testing; TSV; statistical adaptive test method; zero defect IC quality; zero defect IC reliability; Computers; Conferences; Manufacturing; Testing; Three-dimensional displays; Tutorials;
Conference_Titel :
Test Symposium (ATS), 2013 22nd Asian
Conference_Location :
Jiaosi Township
