DocumentCode :
658567
Title :
Path Constraint Solving Based Test Generation for Hard-to-Reach States
Author :
Yanhong Zhou ; Tiancheng Wang ; Tao Lv ; Huawei Li ; Xiaowei Li
Author_Institution :
State Key Lab. of Comput. Archit., Inst. of Comput. Technol., Beijing, China
fYear :
2013
fDate :
18-21 Nov. 2013
Firstpage :
239
Lastpage :
244
Abstract :
Test generation for hard-to-reach states has been one of the hardest tasks in functional verification. In this paper, we present PACOST, a PAth Constraint Solving based Test generation method which operates in an abstraction-guided simulation framework to cover hard-to-reach states. PACOST combines concrete simulation and symbolic simulation in a path constraint solver to generate a set of valid input vectors for exploring different simulation paths, followed by next state selection considering abstract distances. In addition, two backtracking strategies are proposed to alleviate the dead end problem and ensure fast converge to the target state. Experimental results show that PACOST is effective in covering hard-to-reach states.
Keywords :
automatic test pattern generation; backtracking; circuit simulation; constraint handling; electronic engineering computing; formal verification; integrated circuit testing; PACOST; abstract distances; abstraction-guided simulation framework; backtracking strategies; concrete simulation; functional verification; hard-to-reach states; next state selection; path constraint solver; path constraint solving based test generation method; simulation paths; symbolic simulation; Abstracts; Analytical models; Concrete; Engines; Radiation detectors; Registers; Vectors; abstraction-guided simulation; functional test generation; hard-to-reach states; path constraint solving;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium (ATS), 2013 22nd Asian
Conference_Location :
Jiaosi Township
ISSN :
1081-7735
Type :
conf
DOI :
10.1109/ATS.2013.52
Filename :
6690648
Link To Document :
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