DocumentCode :
658916
Title :
A low voltage 8-T SRAM with PVT-tracking bitline sensing margin enhancement for high operating temperature (up to 300°C)
Author :
Kim, Tony T. ; Ngoc Le Ba
Author_Institution :
IC Design Centre of Excellence, Nanyang Technol. Univ., Singapore, Singapore
fYear :
2013
fDate :
11-13 Nov. 2013
Firstpage :
233
Lastpage :
236
Abstract :
An 8-Kbit low power 8-T SRAM for high temperature (up to 300°C) applications is presented. Near-threshold operation is selected for minimum performance variations over a wide temperate range. We proposed a PVT-tracking bitline sensing margin enhancement technique to improve the bitline swing and the sensing window. Test chips fabricated in a commercial 1.0-μm SOI technology with high temperature interconnection option demonstrates successful SRAM operation at 2 V, 300°C. The power consumption and access time of 0.94 mW and 256ns was achieved at 2 V and 300°C.
Keywords :
SRAM chips; low-power electronics; silicon-on-insulator; PVT-tracking bitline sensing margin enhancement; SOI technology; bitline swing; low voltage 8-T SRAM; memory size 8 KByte; near-threshold operation; performance variations; power 0.94 mW; sensing window; size 1.0 mum; temperature 300 degC; time 256 ns; voltage 2 V; CMOS integrated circuits; Integrated circuit interconnections; Reliability; SRAM cells; Temperature sensors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference (A-SSCC), 2013 IEEE Asian
Conference_Location :
Singapore
Print_ISBN :
978-1-4799-0277-4
Type :
conf
DOI :
10.1109/ASSCC.2013.6691025
Filename :
6691025
Link To Document :
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