• DocumentCode
    659020
  • Title

    Improving platform energy-chip area trade-off in near-threshold computing environment

  • Author

    Hao Wang ; Sinkar, Abhishek A. ; Nam Sung Kim

  • Author_Institution
    Univ. of Wisconsin-Madison, Madison, WI, USA
  • fYear
    2013
  • fDate
    18-21 Nov. 2013
  • Firstpage
    318
  • Lastpage
    325
  • Abstract
    Recent studies on near-threshold computing (NTC) investigated an optimum supply voltage which yields minimum energy per operation (Emin), and proposed various optimization techniques at the device, circuit, and architecture levels to further minimize Emn. However, most of these studies often overlooked the significance of (i) energy consumption of off-chip memory accesses; (ii) energy loss of voltage regulators (VRs); and (iii) the cost of chip area in NTC environment. In this paper, we first demonstrate the increasing significance of (i) and (ii) in NTC environment with a comprehensive set of device, circuit, and architectural-level models. Second, we explore technology optimization to improve the trade-off between platform energy and chip area considering (iii) in NTC environment. The experimental results show that our optimized technology achieves 4% to 21% energy reduction for various chip area constraints, achieving significant improvement in trade-off between platform energy and chip area for a wide range of parallel benchmarks.
  • Keywords
    energy consumption; parallel processing; power aware computing; voltage regulators; NTC environment; architectural-level models; architecture level optimization techniques; circuit level optimization techniques; circuit-level models; device level optimization techniques; device-level models; energy reduction; minimum energy per operation; near-threshold computing environment; off-chip memory access energy consumption; optimum supply voltage; parallel benchmarks; platform energy-chip area trade-off; voltage regulator energy loss; Analytical models; Benchmark testing; Energy consumption; Energy efficiency; Memory management; Optimization; Throughput;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Design (ICCAD), 2013 IEEE/ACM International Conference on
  • Conference_Location
    San Jose, CA
  • ISSN
    1092-3152
  • Type

    conf

  • DOI
    10.1109/ICCAD.2013.6691138
  • Filename
    6691138