DocumentCode
659179
Title
Novel tight classification error bounds under mismatch conditions based on f-Divergence
Author
Schluter, Ralf ; Nussbaum-Thom, Markus ; Beck, Erwin ; Alkhouli, Tamer ; Ney, Hermann
Author_Institution
Comput. Sci. Dept., RWTH Aachen Univ., Aachen, Germany
fYear
2013
fDate
9-13 Sept. 2013
Firstpage
1
Lastpage
5
Abstract
By default, statistical classification/multiple hypothesis testing is faced with the model mismatch introduced by replacing the true distributions in Bayes decision rule by model distributions estimated on training samples. Although a large number of statistical measures exist w.r.t. to the mismatch introduced, these works rarely relate to the mismatch in accuracy, i.e. the difference between model error and Bayes error. In this work, the accuracy mismatch between the ideal Bayes decision rule/Bayes test and a mismatched decision rule in statistical classification/multiple hypothesis testing is investigated explicitly. A proof of a novel generalized tight statistical bound on the accuracy mismatch is presented. This result is compared to existing statistical bounds related to the total variational distance that can be extended to bounds of the accuracy mismatch. The analytic results are supported by distribution simulations.
Keywords
Bayes methods; error statistics; pattern classification; statistical analysis; Bayes decision rule; Bayes error; Bayes test; accuracy mismatch; f-divergence; mismatched decision; model distributions; model error; model mismatch; multiple hypothesis testing; novel generalized tight statistical bound; statistical classification; statistical measures; total variational distance; training samples; Accuracy; Analytical models; Convex functions; Joints; Probability distribution; Testing; Training;
fLanguage
English
Publisher
ieee
Conference_Titel
Information Theory Workshop (ITW), 2013 IEEE
Conference_Location
Sevilla
Print_ISBN
978-1-4799-1321-3
Type
conf
DOI
10.1109/ITW.2013.6691302
Filename
6691302
Link To Document