DocumentCode :
659911
Title :
Enhanced Lee In-Building Model
Author :
Lee, David J. Y. ; Lee, William C. Y.
Author_Institution :
Cisco Syst., San Jose, CA, USA
fYear :
2013
fDate :
2-5 Sept. 2013
Firstpage :
1
Lastpage :
6
Abstract :
This paper provides a complete solution for building related propagation, starting by validating the Lee In-building model [1-3] for the single floor scenario. Then how the enhanced Lee In-building model performs in inter-floor and inter-building cases are discussed. Measurement data were collected from 2.4G WLAN developed systems installed in many different floors in two different buildings which are connected with a corridor. The data are from multiple single floor measurements, inter floor measurement and inter building measurements. The FDTD and Ray Tracing models [4-9] was used to validate the measured with the Lee model. The results show that the Lee model outperforms the FDTD and Ray Tracing models in both speed and accuracy. The propagation environment is quite unique and challenging for this deployment. The Lee model was used to optimize the coverage and minimize the interference while fine tuning radio parameters (antenna types, ERP, down tilt) to improve system performances. The net results were continuous connectivity with smooth roaming and high throughput which provided a different experience for users.
Keywords :
finite difference time-domain analysis; minimisation; mobility management (mobile radio); radiofrequency interference; radiowave propagation; ray tracing; wireless LAN; FDTD model; Lee In-building model; WLAN; building related propagation; coverage optimization; fine tuning radio parameters; frequency 2.4 GHz; inter building measurement; inter floor measurement; interference minimization; propagation environment; ray tracing model; smooth roaming; system performance improvement; throughput; Diffraction; Finite difference methods; Floors; Propagation losses; Receivers; Time-domain analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vehicular Technology Conference (VTC Fall), 2013 IEEE 78th
Conference_Location :
Las Vegas, NV
ISSN :
1090-3038
Type :
conf
DOI :
10.1109/VTCFall.2013.6692189
Filename :
6692189
Link To Document :
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