• DocumentCode
    659915
  • Title

    Equivalent Tapped Delay Line Channel Responses with Reduced Taps

  • Author

    Sagari, Shweta ; Trappe, Wade ; Greenstein, L.

  • Author_Institution
    WINLAB, Rutgers Univ., North Brunswick, NJ, USA
  • fYear
    2013
  • fDate
    2-5 Sept. 2013
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Typically, a multipath channel response can be characterized as a sum of Rayleigh-fading ´´rays´´, each defined by a time delay and a mean-square amplitude. Therefore, the channel response can be largely described by a power delay profile (PDP), which is the set of mean-square ray amplitudes and relative delays. Here, we address the following question: Given an actual (or ´´true´´) PDP, PDP(τ), which may have many rays, is there a 3-ray (i.e. 3- tap) equivalent response, derivable from PDP(τ), that can be used to accurately estimate the average bit error rate, <;BER>, vs. receiver input signal- to-noise ratio, SNR? The results reported here give an affirmative answer, e.g., for <;BER> values down to = 10-4, the required SNR using a 3-tap equivalent channel response is less than 1.1 dB larger than that required for the ´´true´´ channel. This agreement can be improved upon, suggesting further work on deriving and evaluating equivalent 3-tap channels. We discuss the benefits of such simplifications for hardware emulators as well as for simulation and analysis.
  • Keywords
    Rayleigh channels; delay lines; error statistics; multipath channels; 3-ray equivalent response; 3-tap equivalent channel response; PDP; Rayleigh-fading; average bit error rate estimation; equivalent tapped delay line channel response; hardware emulators; mean-square ray amplitude; multipath channel response; power delay profile; receiver input signal- to-noise ratio; relative delay; time delay; Approximation methods; Bandwidth; Bit error rate; Delays; Gain; Receivers; Signal to noise ratio;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vehicular Technology Conference (VTC Fall), 2013 IEEE 78th
  • Conference_Location
    Las Vegas, NV
  • ISSN
    1090-3038
  • Type

    conf

  • DOI
    10.1109/VTCFall.2013.6692193
  • Filename
    6692193