Title :
Error Rate Analysis of Cognitive Radio Transmissions with Imperfect Channel Sensing
Author :
Ozcan, Gozde ; Gursoy, M. Cenk ; Gezici, Sinan
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Syracuse Univ., Syracuse, NY, USA
Abstract :
In this paper, error rate performance of cognitive radio transmissions is studied in the presence of imperfect channel sensing decisions. It is assumed that cognitive users first perform channel sensing, albeit with possible errors. Then, depending on the sensing decisions, they select the transmission energy level and employ MI × MQ rectangular quadrature amplitude modulation (QAM) for data transmission over a fading channel. In this setting, the optimal decision rule is formulated under the assumptions that the receiver is equipped with the sensing decision and perfect knowledge of the channel fading. It is shown that the thresholds for optimal detection at the receiver are the midpoints between the signals under any sensing decision. Subsequently, minimum average error probability expressions for M-ary pulse amplitude modulation (M-PAM) and MI × MQ rectangular QAM transmissions attained with the optimal detector are derived. The effects of imperfect channel sensing decisions on the average symbol error probability are analyzed.
Keywords :
cognitive radio; fading channels; probability; pulse amplitude modulation; quadrature amplitude modulation; M-PAM; M-ary pulse amplitude modulation; average symbol error probability; channel fading; cognitive radio transmissions; cognitive users; data transmission; error rate analysis; error rate performance; fading channel; imperfect channel sensing decisions; minimum average error probability expressions; optimal decision rule; optimal detection; optimal detector; rectangular QAM transmissions; rectangular quadrature amplitude modulation; transmission energy level; Cognitive radio; Error analysis; Error probability; Fading; Interference; Quadrature amplitude modulation; Sensors;
Conference_Titel :
Vehicular Technology Conference (VTC Fall), 2013 IEEE 78th
Conference_Location :
Las Vegas, NV
DOI :
10.1109/VTCFall.2013.6692196