Title :
Injection control technique for high speed switching with a double gate PNM-IGBT
Author :
Sumitomo, Masakiyo ; Sakane, Hiroki ; Arakawa, Kazuki ; Higuchi, Yasushi ; Matsui, Masaki
Author_Institution :
Res. Labs., DENSO Corp., Nisshin, Japan
Abstract :
We proposed a PNM-IGBT [1] that can realize performance close to the theoretical limit shown by Nakagawa, et, al [2, 3]. In that work, we confirmed PNM-IGBT can achieve a very low saturation voltage due to its great injection enhancement effect. However, it is accompanied by a slight increase in turn-off-loss. We believe that we can diminish this increase by our unique control technique. Therefore, in this paper, we propose a fundamentally new IGBT control technique. By combining this control technique and PNM-IGBT, it becomes possible to achieve both a low saturation voltage and fast switching speed. To demonstrate the above hypothesis, we have developed a double gate PNM-IGBT, and confirmed a decrease in turn-off-loss of 30% using this technique.
Keywords :
angular velocity control; insulated gate bipolar transistors; double gate PNM-IGBT; high speed switching; injection control technique; injection enhancement effect; saturation voltage; turn-off-loss; Fabrication; Insulated gate bipolar transistors; Logic gates; Silicon; Time measurement; Voltage control; Voltage measurement;
Conference_Titel :
Power Semiconductor Devices and ICs (ISPSD), 2013 25th International Symposium on
Conference_Location :
Kanazawa
Print_ISBN :
978-1-4673-5134-8
DOI :
10.1109/ISPSD.2013.6694392