• DocumentCode
    661528
  • Title

    Injection control technique for high speed switching with a double gate PNM-IGBT

  • Author

    Sumitomo, Masakiyo ; Sakane, Hiroki ; Arakawa, Kazuki ; Higuchi, Yasushi ; Matsui, Masaki

  • Author_Institution
    Res. Labs., DENSO Corp., Nisshin, Japan
  • fYear
    2013
  • fDate
    26-30 May 2013
  • Firstpage
    33
  • Lastpage
    36
  • Abstract
    We proposed a PNM-IGBT [1] that can realize performance close to the theoretical limit shown by Nakagawa, et, al [2, 3]. In that work, we confirmed PNM-IGBT can achieve a very low saturation voltage due to its great injection enhancement effect. However, it is accompanied by a slight increase in turn-off-loss. We believe that we can diminish this increase by our unique control technique. Therefore, in this paper, we propose a fundamentally new IGBT control technique. By combining this control technique and PNM-IGBT, it becomes possible to achieve both a low saturation voltage and fast switching speed. To demonstrate the above hypothesis, we have developed a double gate PNM-IGBT, and confirmed a decrease in turn-off-loss of 30% using this technique.
  • Keywords
    angular velocity control; insulated gate bipolar transistors; double gate PNM-IGBT; high speed switching; injection control technique; injection enhancement effect; saturation voltage; turn-off-loss; Fabrication; Insulated gate bipolar transistors; Logic gates; Silicon; Time measurement; Voltage control; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices and ICs (ISPSD), 2013 25th International Symposium on
  • Conference_Location
    Kanazawa
  • ISSN
    1943-653X
  • Print_ISBN
    978-1-4673-5134-8
  • Type

    conf

  • DOI
    10.1109/ISPSD.2013.6694392
  • Filename
    6694392