DocumentCode
661533
Title
Breakthrough in trade-off between threshold voltage and specific on-resistance of SiC-MOSFETs
Author
Furuhashi, Masayuki ; Tanioka, Toshikazu ; Ebiike, Yuji ; Suekawa, Eisuke ; Tarui, Yoichiro ; Sakai, Shinji ; Yutani, Naoki ; Miura, Naruhisa ; Imaizumi, Masayuki ; Yamakawa, Satoshi ; Oomori, Tatsuo
Author_Institution
Adv. Technol. R&D Center, Mitsubishi Electr. Corp., Amagasaki, Japan
fYear
2013
fDate
26-30 May 2013
Firstpage
55
Lastpage
58
Abstract
The threshold voltage of 4H-SiC MOSFET increases drastically by performing wet oxidation after nitridation of gate oxide without significant decrease in the channel effective mobility. The increment of the threshold voltage depends on the wet oxidation conditions, and wet oxidation improves the trade-off between the threshold voltage and the specific on-resistance. We fabricated 600 V 4H-SiC MOSFETs with a threshold voltage of 5.11 V and a specific on-resistance of 5.2 mΩcm2 using the procedure above. The stability of the threshold voltage for the SiC-MOSFETs was confirmed by a HTGB test.
Keywords
MOSFET; nitridation; oxidation; semiconductor device testing; silicon compounds; wetting; wide band gap semiconductors; HTGB test; MOSFET; SiC; channel effective mobility; nitridation; specific on-resistance; stability; threshold voltage stability; voltage 5.11 V; voltage 600 V; wet oxidation; Logic gates; MOSFET; Oxidation; Silicon carbide; Temperature measurement; Threshold voltage; Voltage measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Semiconductor Devices and ICs (ISPSD), 2013 25th International Symposium on
Conference_Location
Kanazawa
ISSN
1943-653X
Print_ISBN
978-1-4673-5134-8
Type
conf
DOI
10.1109/ISPSD.2013.6694397
Filename
6694397
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