• DocumentCode
    661533
  • Title

    Breakthrough in trade-off between threshold voltage and specific on-resistance of SiC-MOSFETs

  • Author

    Furuhashi, Masayuki ; Tanioka, Toshikazu ; Ebiike, Yuji ; Suekawa, Eisuke ; Tarui, Yoichiro ; Sakai, Shinji ; Yutani, Naoki ; Miura, Naruhisa ; Imaizumi, Masayuki ; Yamakawa, Satoshi ; Oomori, Tatsuo

  • Author_Institution
    Adv. Technol. R&D Center, Mitsubishi Electr. Corp., Amagasaki, Japan
  • fYear
    2013
  • fDate
    26-30 May 2013
  • Firstpage
    55
  • Lastpage
    58
  • Abstract
    The threshold voltage of 4H-SiC MOSFET increases drastically by performing wet oxidation after nitridation of gate oxide without significant decrease in the channel effective mobility. The increment of the threshold voltage depends on the wet oxidation conditions, and wet oxidation improves the trade-off between the threshold voltage and the specific on-resistance. We fabricated 600 V 4H-SiC MOSFETs with a threshold voltage of 5.11 V and a specific on-resistance of 5.2 mΩcm2 using the procedure above. The stability of the threshold voltage for the SiC-MOSFETs was confirmed by a HTGB test.
  • Keywords
    MOSFET; nitridation; oxidation; semiconductor device testing; silicon compounds; wetting; wide band gap semiconductors; HTGB test; MOSFET; SiC; channel effective mobility; nitridation; specific on-resistance; stability; threshold voltage stability; voltage 5.11 V; voltage 600 V; wet oxidation; Logic gates; MOSFET; Oxidation; Silicon carbide; Temperature measurement; Threshold voltage; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices and ICs (ISPSD), 2013 25th International Symposium on
  • Conference_Location
    Kanazawa
  • ISSN
    1943-653X
  • Print_ISBN
    978-1-4673-5134-8
  • Type

    conf

  • DOI
    10.1109/ISPSD.2013.6694397
  • Filename
    6694397