• DocumentCode
    661565
  • Title

    800V lateral IGBT in bulk Si for low power compact SMPS applications

  • Author

    Trajkovic, T. ; Udugampola, N. ; Pathirana, V. ; Camuso, G. ; Udrea, F. ; Amaratunga, G.A.J.

  • Author_Institution
    Eng. Dept., Cambridge Univ., Cambridge, UK
  • fYear
    2013
  • fDate
    26-30 May 2013
  • Firstpage
    401
  • Lastpage
    404
  • Abstract
    An 800V rated lateral IGBT for high frequency, low-cost off-line applications has been developed. The LIGBT features a new method of adjusting the bipolar gain, based on a floating N+ stripe in front of the P+ anode/drain region. The floating N+ layer enhances the carrier recombination at the anode/drain side of the drift region resulting in a very significant decrease in the turn-off speed and substantially lower overall losses. Switching speeds as low as 140ns at 25oC and 300ns at 125oC have been achieved with corresponding equivalent Rdson at 125oC below 90mΩ.cm2. A fully operational AC-DC converter using a controller with an integrated LIGBT+depletion mode MOSFET chip has been designed and qualified in plastic SOP8 packages and used in 5W, 65kHz SMPS applications. The device is fabricated in 0.6μm bulk silicon CMOS technology without any additional masking steps.
  • Keywords
    CMOS integrated circuits; MOSFET; elemental semiconductors; insulated gate bipolar transistors; low-power electronics; silicon; switched mode power supplies; AC-DC converter; P+ anode-drain region; Si; bipolar gain; bulk silicon CMOS technology; floating N+ stripe; frequency 65 kHz; integrated LIGBT+depletion mode MOSFET chip; lateral IGBT; low power compact SMPS applications; plastic SOP8 packages; power 5 W; size 0.6 mum; switching speeds; temperature 125 degC; temperature 25 degC; time 140 ns; time 300 ns; voltage 800 V; Anodes; Insulated gate bipolar transistors; Logic gates; MOSFET; Silicon; Switches; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices and ICs (ISPSD), 2013 25th International Symposium on
  • Conference_Location
    Kanazawa
  • ISSN
    1943-653X
  • Print_ISBN
    978-1-4673-5134-8
  • Type

    conf

  • DOI
    10.1109/ISPSD.2013.6694430
  • Filename
    6694430