Title :
A high reliable reverse-conducting IGBT with a floating P-plug
Author :
Weizhong Chen ; Zehong Li ; Min Ren ; JinPing Zhang ; Bo Zhang ; Yong Liu ; Qing Hua ; Kun Mao ; Zhaoji Li
Author_Institution :
State Key Lab. of Electron. Thin Films & Integrated Devices, Univ. of Electron. Sci. & Technol. of China (UESTC), Chengdu, China
Abstract :
A current distribution model is presented for the RC-IGBTs both at IGBT mode and DIODE mode. According to the analytical model, smaller cell size would be better for the distribution of the current density and full utilization of the silicon, but the snapback would be worse. Then a novel RC-IGBT with a floating P-plug is proposed and investigated by simulations. The results show that it can suppress the snapback phenomena effectively. More importantly, the silicon utilization ratio is much higher than the others RC-IGBTs and the current is uniformly distributed in the whole wafer both at IGBT mode and DIODE mode that ensured the high temperature reliability of the RC-IGBT.
Keywords :
current distribution; insulated gate bipolar transistors; power semiconductor diodes; semiconductor device models; cell size; current density; current distribution model; diode mode; floating P-plug; high reliable reverse-conducting IGBT; high temperature reliability; snapback phenomena; Current density; Current distribution; Insulated gate bipolar transistors; Logic gates; Simulation; Temperature distribution; Transistors;
Conference_Titel :
Power Semiconductor Devices and ICs (ISPSD), 2013 25th International Symposium on
Conference_Location :
Kanazawa
Print_ISBN :
978-1-4673-5134-8
DOI :
10.1109/ISPSD.2013.6694437
