DocumentCode :
661591
Title :
Low reverse recovery charge 30-V power MOSFETs for DC-DC converters
Author :
Hirao, Takashi ; Hashimoto, Takayuki ; Shirai, Nobuyuki ; Arai, Hiroki ; Matsuura, Nobuyoshi ; Matsuura, Hitoshi
Author_Institution :
Hitachi Res. Lab., Hitachi, Ltd., Hitachi, Japan
fYear :
2013
fDate :
26-30 May 2013
Firstpage :
221
Lastpage :
224
Abstract :
Two low reverse recovery charge solutions for 30-V power MOSFETs are proposed. One solution is a device consisting of a MOSFET and a Schottky barrier diode (SBD) in a single chip featuring a double epi structure to enhance the breakdown voltage. The other solution is a device with an integrated SBD in every unit cell that can achieve a high threshold voltage via the P- layer with Schottky contact. Both proposed devices exhibited low reverse recovery currents in simulations. Moreover, the surge voltage of the first device which we fabricated reduced by 58%, which enables the use of a lower voltage device and a reduction of the device loss.
Keywords :
DC-DC power convertors; Schottky barriers; Schottky diodes; electric breakdown; power MOSFET; DC-DC converter; SBD; Schottky barrier diode; Schottky contact; breakdown voltage; device loss reduction; double epi structure; low reverse recovery charge power MOSFET; reverse recovery current; surge voltage; threshold voltage; voltage 30 V; Junctions; MOSFET; Periodic structures; Schottky barriers; Schottky diodes; Surges; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Semiconductor Devices and ICs (ISPSD), 2013 25th International Symposium on
Conference_Location :
Kanazawa
ISSN :
1943-653X
Print_ISBN :
978-1-4673-5134-8
Type :
conf
DOI :
10.1109/ISPSD.2013.6694456
Filename :
6694456
Link To Document :
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