Title :
Experimental investigation of transient electrical, thermal and mechanical behavior of IGBT inverter modules during operation
Author :
Nagl, B. ; Czerny, B. ; Lederer, M. ; Khatibi, G. ; Thoben, M. ; Nicolics, J.
Author_Institution :
Siemens AG, Vienna, Austria
Abstract :
This study comprises the electrical analysis of an experimental investigation on thermo-mechanical vibration measurements on an IGBT inverter structure under operating conditions and shows a new way how to experience reliability relevant phenomena. In order to perform transient temperature measurements with IR thermography and optical vibration measurements one sub-system of the inverter module was extracted and operated at equivalent conditions. Necessary circuit modifications including parasitic impedances and their most important influences are discussed. The investigation revealed a strong dependence of the thermo-mechanical bonding wire vibrations on the inverter output frequency. At 1 Hz an amplitude of more than 4 μm was measured at the loop peak of a short bonding wire.
Keywords :
infrared imaging; insulated gate bipolar transistors; invertors; lead bonding; semiconductor device reliability; temperature measurement; vibration measurement; IGBT inverter modules; IR thermography; circuit modifications; equivalent conditions; mechanical behavior; operating conditions; optical vibration measurements; parasitic impedances; reliability relevant phenomena; thermal behavior; thermomechanical bonding wire vibrations; thermomechanical vibration measurements; transient electrical behavior; transient temperature measurements; Capacitance; Insulated gate bipolar transistors; Inverters; Logic gates; Switches; Temperature measurement; Wires;
Conference_Titel :
Power Semiconductor Devices and ICs (ISPSD), 2013 25th International Symposium on
Conference_Location :
Kanazawa
Print_ISBN :
978-1-4673-5134-8
DOI :
10.1109/ISPSD.2013.6694467