Title :
SiC symmetric blocking terminations using orthogonal positive bevel termination and Junction Termination Extension
Author :
Xing Huang ; Baliga, B. Jayant ; Huang, Alex Q. ; Suvorov, Alexander ; Capell, Craig ; Lin Cheng ; Agarwal, Anant
Author_Institution :
FREEDM Syst. Center, North Carolina State Univ., Raleigh, NC, USA
Abstract :
Symmetric blocking power semiconductor switches require two edge terminations, one for the reverse blocking junction and the other one for the forward blocking junction. In this work, we demonstrated 1100V SiC symmetric blocking edge terminations using orthogonal positive bevel (OPB) termination and a one-zone Junction Termination Extension (JTE). The OPB was formed by orthogonally sawing 45° V-shape trenches into the SiC wafer with a diamond-coated dicing blade. The surface damage was then repaired with dry-etch in SF6/O2 plasma, which reduced the leakage current by around two orders of magnitude. As limited by field reach-through, both the OPB and the JTE terminations show breakdown voltage of 1100V. The P+P-N+ diodes fabricated on the same wafer with the OPB termination showed 1610V avalanche breakdown which was around 83% of ideal value.
Keywords :
leakage currents; power semiconductor diodes; power semiconductor switches; semiconductor junctions; silicon compounds; sputter etching; wide band gap semiconductors; JTE terminations; OPB termination; P+P-N+ diodes; SiC; V-shape trenches; diamond-coated dicing blade; dry-etch; edge terminations; forward blocking junction; leakage current; one-zone junction termination extension; orthogonal positive bevel termination; reverse blocking junction; surface damage; symmetric blocking edge terminations; symmetric blocking power semiconductor switches; voltage 1100 V; voltage 1610 V; Avalanche breakdown; Epitaxial layers; Junctions; Leakage currents; Silicon carbide; Surface treatment;
Conference_Titel :
Power Semiconductor Devices and ICs (ISPSD), 2013 25th International Symposium on
Conference_Location :
Kanazawa
Print_ISBN :
978-1-4673-5134-8
DOI :
10.1109/ISPSD.2013.6694475