Title :
A new type of SiC-VJFET with extreme low feedback capacitance
Author :
Ishikawa, Tsuyoshi ; Nomura, Katsuya ; Sugiyama, Takahide ; Uesugi, Tsutomu ; Nishikawa, Koichi
Author_Institution :
Electron. Devices Res. Div., Toyota Central R&D Labs., Inc., Nagakute, Japan
Abstract :
In this paper, we propose a novel SiC vertical JFET (VJFET) with low feedback capacitance Crss by using a device simulator. A key feature of the proposed VJFET is the p+ screen grid inserted between gate and drain electrode. The screen grid is effective to reduce the Crss by 80% compared to conventional VJFETs. Due to the low Crss, total power loss of the proposed VJFET is the lowest among existing SiC power devices. This new VJFET can be a promising candidate for a high-speed and low-loss SiC power device.
Keywords :
capacitance; junction gate field effect transistors; power field effect transistors; silicon compounds; wide band gap semiconductors; SiC; SiC-VJFET; device simulator; extreme low feedback capacitance; p+ screen grid; vertical JFET; Capacitance; JFETs; Logic gates; MOSFET; Silicon carbide; Switches;
Conference_Titel :
Power Semiconductor Devices and ICs (ISPSD), 2013 25th International Symposium on
Conference_Location :
Kanazawa
Print_ISBN :
978-1-4673-5134-8
DOI :
10.1109/ISPSD.2013.6694476