• DocumentCode
    661618
  • Title

    Physics-based analytical model for high-voltage bidirectional GaN transistors using lateral GaN power HEMT

  • Author

    Waldron, J. ; Chow, T.P.

  • Author_Institution
    Center for Integrated Electron., Rensselaer Polytech. Inst., Troy, NY, USA
  • fYear
    2013
  • fDate
    26-30 May 2013
  • Firstpage
    213
  • Lastpage
    216
  • Abstract
    A bidirectional switching GaN transistor, PCB-packaged using commercially available high voltage power GaN HEMTs (200V, 3A) from EPC, has been modeled and characterized. A physics-based FET model, originally developed by Statz for short-channel GaAs MESFET, has been adapted to model both static and switching characteristics of both the constituent HEMT and the bidirectional switch up to 125°C. We have found that the Statz model is superior to conventional short-channel MOSFET models due to the mixed pentode-triode on-state I-V characteristics of the EPC GaN HEMT. The bidirectional GaN transistor exhibits linear operation as well as bidirectional current saturation, offering low on-state resistance along with current limiting capabilities.
  • Keywords
    III-V semiconductors; Schottky gate field effect transistors; current limiters; gallium arsenide; power HEMT; printed circuits; semiconductor device packaging; wide band gap semiconductors; EPC HEMT; GaAs; GaN; MOSFET models; PCB-packaging; Statz model; bidirectional current saturation; current limiting capabilities; high-voltage bidirectional transistors; lateral power HEMT; linear operation; low on-state resistance; mixed pentode-triode on-state I-V characteristics; physics-based analytical model; short-channel MESFET; static characteristics; switching characteristics; Capacitance; Gallium nitride; HEMTs; Resistance; Switches; Switching circuits; Bidirectional switch; GaN; HEMT; Wide bandgap semiconductors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices and ICs (ISPSD), 2013 25th International Symposium on
  • Conference_Location
    Kanazawa
  • ISSN
    1943-653X
  • Print_ISBN
    978-1-4673-5134-8
  • Type

    conf

  • DOI
    10.1109/ISPSD.2013.6694483
  • Filename
    6694483