Title :
Physics-based analytical model for high-voltage bidirectional GaN transistors using lateral GaN power HEMT
Author :
Waldron, J. ; Chow, T.P.
Author_Institution :
Center for Integrated Electron., Rensselaer Polytech. Inst., Troy, NY, USA
Abstract :
A bidirectional switching GaN transistor, PCB-packaged using commercially available high voltage power GaN HEMTs (200V, 3A) from EPC, has been modeled and characterized. A physics-based FET model, originally developed by Statz for short-channel GaAs MESFET, has been adapted to model both static and switching characteristics of both the constituent HEMT and the bidirectional switch up to 125°C. We have found that the Statz model is superior to conventional short-channel MOSFET models due to the mixed pentode-triode on-state I-V characteristics of the EPC GaN HEMT. The bidirectional GaN transistor exhibits linear operation as well as bidirectional current saturation, offering low on-state resistance along with current limiting capabilities.
Keywords :
III-V semiconductors; Schottky gate field effect transistors; current limiters; gallium arsenide; power HEMT; printed circuits; semiconductor device packaging; wide band gap semiconductors; EPC HEMT; GaAs; GaN; MOSFET models; PCB-packaging; Statz model; bidirectional current saturation; current limiting capabilities; high-voltage bidirectional transistors; lateral power HEMT; linear operation; low on-state resistance; mixed pentode-triode on-state I-V characteristics; physics-based analytical model; short-channel MESFET; static characteristics; switching characteristics; Capacitance; Gallium nitride; HEMTs; Resistance; Switches; Switching circuits; Bidirectional switch; GaN; HEMT; Wide bandgap semiconductors;
Conference_Titel :
Power Semiconductor Devices and ICs (ISPSD), 2013 25th International Symposium on
Conference_Location :
Kanazawa
Print_ISBN :
978-1-4673-5134-8
DOI :
10.1109/ISPSD.2013.6694483