• DocumentCode
    66233
  • Title

    A Classification Method for Complex Power Quality Disturbances Using EEMD and Rank Wavelet SVM

  • Author

    Zhigang Liu ; Yan Cui ; Wenhui Li

  • Author_Institution
    Sch. of Electr. Eng., Southwest Jiaotong Univ., Chengdu, China
  • Volume
    6
  • Issue
    4
  • fYear
    2015
  • fDate
    Jul-15
  • Firstpage
    1678
  • Lastpage
    1685
  • Abstract
    This paper aims to develop a combination method for the classification of power quality complex disturbances based on ensemble empirical mode decomposition (EEMD) and multilabel learning. EEMD is adopted to extract the features of complex disturbances, which is more suitable to the nonstationary signal processing. Rank wavelet support vector machine (rank-WSVM) is proposed to apply in the classification of complex disturbances. First, the characteristic quantities of complex disturbances are obtained with EEMD through defining standard energy differences of each intrinsic mode function. Second, after the optimization of rank-SVM, based on wavelet kernel function, the ranking function, and multilabel function are, respectively, constructed. Lastly, rank-WSVM is applied to classify the complex disturbances. Simulation results and real-time digital simulator tests show that for different signal to noise ratio, the rank-WSVM classification performance of complex disturbances including hamming loss, ranking loss, one-error, coverage, and average precision, is generally better than the other three methods, namely rank-SVM, multilabel naive Bayes, and multilabel learning with backpropagation.
  • Keywords
    Bayes methods; backpropagation; feature extraction; optimisation; power engineering computing; power supply quality; power system faults; signal classification; singular value decomposition; support vector machines; EEMD; backpropagation; complex disturbance classification; complex power quality disturbance; ensemble empirical mode decomposition; feature extraction; hamming loss; intrinsic mode function; multilabel function; multilabel learning; multilabel naive Bayes; nonstationary signal processing; optimization; rank wavelet SVM; rank-WSVM; ranking function; ranking loss; real-time digital simulator tests; signal to noise ratio; support vector machine; wavelet kernel function; Kernel; Measurement; Oscillators; Support vector machines; Transient analysis; Voltage fluctuations; Wavelet transforms; Classification; complex disturbances; ensemble empirical mode decomposition (EEMD); rank wavelet support vector machine (rank-WSVM);
  • fLanguage
    English
  • Journal_Title
    Smart Grid, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1949-3053
  • Type

    jour

  • DOI
    10.1109/TSG.2015.2397431
  • Filename
    7042293