Guided-Mode Analysis of Tamm-Plasmon Polariton at Metal–Heterostructure Dielectric Interface

We present a comprehensive analysis for transverse electric (TE) and transverse magnetic (TM) polarized guided Tamm-plasmon polariton (TPP) mode at metal-heterostructure media interface. We explicitly show that the quarter-wavelength stack condition will not be satisfied for TE or TM polarized TPP mode due to the existence of null-point at metal-heterostructure media boundary. Therefore, we propose an alternate route to design TPP waveguide by solving the mode-dispersion relation for different geometrical parameters in a TiO₂/SiO₂ bilayer system. The guided TPP-modes (TE and TM) exhibit interesting dispersion characteristics which can be tailored as per the desired application. The group index of TM polarized TPP mode remains constant over a significant wavelength range which results into zero group-velocity dispersion (GVD) at λ ≈ 630 nm wavelength. Also, the propagation length for TM-polarized TPP modes vary between 25 μm to 50 μm in a 630-650 nm wavelength range. However, the variation of GVD for TE-modes exhibit a monotonic variation with an exceptionally large GVD ≈ -3 × 10⁴ ps/km·nm around λ = 632.8 nm.