DocumentCode :
662652
Title :
Table of contents
fYear :
2013
fDate :
27-29 Oct. 2013
Firstpage :
1
Lastpage :
7
Abstract :
The following topics are dealt with: GaN devices; GaN based circuit prototyping; SiC devices; SiC based power module and integrated circuits; high performance gate drive; packaging; device testing; wide bandgap based high power circuits; gate and interface; switch applications; device evaluation and modeling; operation and reliability.
Keywords :
III-V semiconductors; gallium compounds; modules; monolithic integrated circuits; power integrated circuits; power semiconductor devices; semiconductor device models; semiconductor device packaging; semiconductor device reliability; semiconductor device testing; silicon compounds; wide band gap semiconductors; GaN based circuit prototyping; GaN devices; SiC based power module; device evaluation; device modeling; device operation; device testing; high performance gate drive; integrated circuits; interface; packaging; reliability; switch applications; wide bandgap based high power circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Wide Bandgap Power Devices and Applications (WiPDA), 2013 IEEE Workshop on
Conference_Location :
Columbus, OH
Type :
conf
DOI :
10.1109/WiPDA.2013.6695546
Filename :
6695546
Link To Document :
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