DocumentCode :
662674
Title :
From TCAD device simulation to scalable compact model development for GaN HEMT powerbar designs
Author :
Stoffels, Steve ; Ronchi, Nicolo ; De Jaeger, B. ; Marcon, Denis ; Decoutere, Stefaan ; Strauss, Severin ; Erlebach, Axel ; Cilento, Tommaso
Author_Institution :
imec, PMST, Leuven, Belgium
fYear :
2013
fDate :
27-29 Oct. 2013
Firstpage :
88
Lastpage :
91
Abstract :
For this work we have developed a model based flow for designing AlGaN/GaN power bars, taking into account the physics of the GaN HEMT architecture.. A link is generated between TCAD simulation and circuit simulations for GaN HEMT devices. A scalable compact model was developed, with analytical models for the extrinsic interconnect parasitics and access resistances. This modeling approach allows simulation of large area power bars based on TCAD simulations, and is, to the best of our knowledge, the first time that such a modeling approach is presented for GaN devices.
Keywords :
III-V semiconductors; aluminium compounds; circuit simulation; gallium compounds; power HEMT; semiconductor device models; technology CAD (electronics); wide band gap semiconductors; AlGaN-GaN; GaN HEMT powerbar designs; TCAD device simulation; access resistances; circuit simulations; extrinsic interconnect parasitics; scalable compact model development; Analytical models; Computational modeling; Gallium nitride; HEMTs; Integrated circuit modeling; Logic gates; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Wide Bandgap Power Devices and Applications (WiPDA), 2013 IEEE Workshop on
Conference_Location :
Columbus, OH
Type :
conf
DOI :
10.1109/WiPDA.2013.6695569
Filename :
6695569
Link To Document :
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