• DocumentCode
    662674
  • Title

    From TCAD device simulation to scalable compact model development for GaN HEMT powerbar designs

  • Author

    Stoffels, Steve ; Ronchi, Nicolo ; De Jaeger, B. ; Marcon, Denis ; Decoutere, Stefaan ; Strauss, Severin ; Erlebach, Axel ; Cilento, Tommaso

  • Author_Institution
    imec, PMST, Leuven, Belgium
  • fYear
    2013
  • fDate
    27-29 Oct. 2013
  • Firstpage
    88
  • Lastpage
    91
  • Abstract
    For this work we have developed a model based flow for designing AlGaN/GaN power bars, taking into account the physics of the GaN HEMT architecture.. A link is generated between TCAD simulation and circuit simulations for GaN HEMT devices. A scalable compact model was developed, with analytical models for the extrinsic interconnect parasitics and access resistances. This modeling approach allows simulation of large area power bars based on TCAD simulations, and is, to the best of our knowledge, the first time that such a modeling approach is presented for GaN devices.
  • Keywords
    III-V semiconductors; aluminium compounds; circuit simulation; gallium compounds; power HEMT; semiconductor device models; technology CAD (electronics); wide band gap semiconductors; AlGaN-GaN; GaN HEMT powerbar designs; TCAD device simulation; access resistances; circuit simulations; extrinsic interconnect parasitics; scalable compact model development; Analytical models; Computational modeling; Gallium nitride; HEMTs; Integrated circuit modeling; Logic gates; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Wide Bandgap Power Devices and Applications (WiPDA), 2013 IEEE Workshop on
  • Conference_Location
    Columbus, OH
  • Type

    conf

  • DOI
    10.1109/WiPDA.2013.6695569
  • Filename
    6695569