Title :
Reliability investigations and improvements of interconnection technologies for the wireless brain-machine interface — ‘BrainCon’
Author :
Kohler, Fabian ; Ulloa, Miguel A. ; Ordonez, Juan S. ; Stieglitz, T. ; Schuettler, Martin
Author_Institution :
Dept. of Microsyst. Eng., Univ. of Freiburg, Freiburg, Germany
Abstract :
We developed an implantable wireless, hermetically sealed brain-computer interface which is intended to stay functional within the body for decades. Such an ambitious task demands interconnection technologies of high reliability and reproducibility. Investigating soft-soldering, poor wetting behavior of SnAg solder and destructive influences of additional fluxing materials excluded the lead-free compound from our list of suitable sealing and interconnection materials. We developed a robust and reliable welded interconnection method, which allows us to join a multichannel electrode array, even if materials such as MP35N are involved, which are inherently difficult to solder. For solder-sealing of the implant package with leakage rates in the desired range of <;10-9mbar l s-1 we found SnPbCu solder to be the best choice.
Keywords :
brain-computer interfaces; medical computing; prosthetics; soldering; BrainCon; brain-computer interface; fluxing materials; implant package; interconnection materials; interconnection technologies; lead-free compound; leakage rates; multichannel electrode array; sealing materials; solder-sealing; welded interconnection method; wireless brain-machine interface; Electrodes; Implants; Reliability; Substrates; Welding; Wires;
Conference_Titel :
Neural Engineering (NER), 2013 6th International IEEE/EMBS Conference on
Conference_Location :
San Diego, CA
DOI :
10.1109/NER.2013.6696108