• DocumentCode
    663117
  • Title

    Reliability investigations and improvements of interconnection technologies for the wireless brain-machine interface — ‘BrainCon’

  • Author

    Kohler, Fabian ; Ulloa, Miguel A. ; Ordonez, Juan S. ; Stieglitz, T. ; Schuettler, Martin

  • Author_Institution
    Dept. of Microsyst. Eng., Univ. of Freiburg, Freiburg, Germany
  • fYear
    2013
  • fDate
    6-8 Nov. 2013
  • Firstpage
    1013
  • Lastpage
    1016
  • Abstract
    We developed an implantable wireless, hermetically sealed brain-computer interface which is intended to stay functional within the body for decades. Such an ambitious task demands interconnection technologies of high reliability and reproducibility. Investigating soft-soldering, poor wetting behavior of SnAg solder and destructive influences of additional fluxing materials excluded the lead-free compound from our list of suitable sealing and interconnection materials. We developed a robust and reliable welded interconnection method, which allows us to join a multichannel electrode array, even if materials such as MP35N are involved, which are inherently difficult to solder. For solder-sealing of the implant package with leakage rates in the desired range of <;10-9mbar l s-1 we found SnPbCu solder to be the best choice.
  • Keywords
    brain-computer interfaces; medical computing; prosthetics; soldering; BrainCon; brain-computer interface; fluxing materials; implant package; interconnection materials; interconnection technologies; lead-free compound; leakage rates; multichannel electrode array; sealing materials; solder-sealing; welded interconnection method; wireless brain-machine interface; Electrodes; Implants; Reliability; Substrates; Welding; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Neural Engineering (NER), 2013 6th International IEEE/EMBS Conference on
  • Conference_Location
    San Diego, CA
  • ISSN
    1948-3546
  • Type

    conf

  • DOI
    10.1109/NER.2013.6696108
  • Filename
    6696108