• DocumentCode
    66319
  • Title

    Development of Self-Calibrating A/D Converters

  • Author

    Lee, Hae-Seung

  • Author_Institution
    Electron. Eng., Seoul Nat. Univ., Seoul, South Korea
  • Volume
    6
  • Issue
    2
  • fYear
    2014
  • fDate
    Spring 2014
  • Firstpage
    18
  • Lastpage
    21
  • Abstract
    Until well after I thought of the self-calibration idea, I believed I was the first one to have recognized the property of the binary weighted capacitor array and exploited it to measure capacitor mismatch - nothing remotely similar had turned up in any of the circuit-type journal or conference publications. I discovered later, to my dismay, McCreary had thought of the same principle and had applied it to characterize capacitor mismatch characteristics [9]. This had been published in IEEE Transactions on Instrumentation and Measurements in 1979 - a journal I had not thought was relevant to data converters. Of course, McCreary used the principle for capacitor matching characterization, not for calibrating ADC´s, but he recognized the important symmetry in a binary weighted capacitor array and used it to measure capacitor mismatch. Along with his pioneering work in charge-redistribution ADC´s, his work laid the foundation for the self-calibrating ADC work presented here. The self-calibrating ADC improved its own accuracy without a factory calibration or a golden standard for the first time. Many other calibration methods followed for various different types of ADC´s including successive-approximation, pipeline, and delta-sigma ADC´s, ultimately finding applications in other analog circuits in the form of now popular digitally-assisted analog circuits.
  • Keywords
    analogue-digital conversion; calibration; capacitors; binary weighted capacitor array; capacitor matching characterization; capacitor mismatch; charge-redistribution ADC; data converters; delta-sigma ADC; digitally-assisted analog circuits; pipeline; self-calibrating A/D converters; successive-approximation; Analog-digital conversion; Calibration; Capacitors; Data conversion; Digital-analog conversion; Integrated circuit technology; MOS integrated circuits;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    1943-0582
  • Type

    jour

  • DOI
    10.1109/MSSC.2014.2314000
  • Filename
    6841777