Title :
Assessing Spike Sorting contribution to neural implant reliability
Author :
Furno, L. ; Rigosa, J. ; Panarese, A. ; Micera, Silvestro
Author_Institution :
Biorobotics Inst., Scuola Superiore Sant´Anna, Pontedera, Italy
Abstract :
Recording up to hundreds of neural electrodes simultaneously is nowadays possible thanks to many commercially available acquisition systems. However the reliability of these data for subsequent encoding or decoding analyses strictly depends on the capability of specific algorithms to identify single neuron contribution from multi-unit activity acquired by each channel. This is an ill-posed problem, which is called Spike Sorting (SS). So far, several algorithms have been proposed, each based on specific features of the recorded electrophysiological data. The spike sorting is the very first phase of the chain analysis of neural spiking activity: an error at this stage would severely propagate further. In this study we investigate how reliable the results of SS algorithms are, by using simulated neural data at different recording conditions. Our findings support the idea that fallibility in attaining stable single-unit neural signals across different recording sessions is not only due to technical features of the neural recording implant, but may significantly depend on propagated error from the SS stage.
Keywords :
bioelectric potentials; biomedical electrodes; data acquisition; data analysis; medical signal processing; neurophysiology; prosthetics; chain analysis; commercially available acquisition systems; data analysis; electrophysiological data; ill-posed problem; multiunit activity; neural electrode recording; neural implant reliability; neural recording implant; neural spiking activity; propagated error; single neuron contribution; spike sorting contribution; stable single-unit neural signals; subsequent data decoding; subsequent data encoding; Algorithm design and analysis; Implants; Neurons; Robustness; Signal to noise ratio; Sorting;
Conference_Titel :
Neural Engineering (NER), 2013 6th International IEEE/EMBS Conference on
Conference_Location :
San Diego, CA
DOI :
10.1109/NER.2013.6696210