Title :
Naturally Clamped Zero-Current Commutated Soft-Switching Current-Fed Push–Pull DC/DC Converter: Analysis, Design, and Experimental Results
Author :
Pan Xuewei ; Rathore, Akshay Kumar
Author_Institution :
Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore, Singapore, Singapore
Abstract :
The proposed converter has the following features: 1) zero-current commutation (ZCC) and natural voltage clamping (NVC) eliminate the need for active-clamp circuits or passive snubbers required to absorb surge voltage in conventional current-fed topologies. 2) Switching losses are reduced significantly owing to zero-current switching of primary-side devices and zero-voltage switching of secondary-side devices. Turn-on switching transition loss of primary devices is also negligible. 3) Soft switching and NVC are inherent and load independent. 4) The voltage across primary-side device is independent of duty cycle with varying input voltage and output power and clamped at rather low reflected output voltage enabling the use of low-voltage semiconductor devices. These merits make the converter good candidate for interfacing low-voltage dc bus with high-voltage dc bus for higher current applications. Steady state, analysis, design, simulation, and experimental results are presented.
Keywords :
DC-DC power convertors; commutation; zero current switching; zero voltage switching; NVC; ZCC; active-clamp circuits; current-fed topology; duty cycle; high-voltage dc bus; low-voltage dc bus; low-voltage semiconductor devices; natural voltage clamping; naturally clamped zero-current commutated soft-switching current-fed push-pull DC-DC converter; passive snubbers; primary-side devices; secondary-side devices; surge voltage; turn-on switching transition loss; zero-current switching; zero-voltage switching; Clamps; Hafnium; Snubbers; Steady-state; Switches; Zero current switching; Zero voltage switching; Current-fed converter; dc/dc converter; natural clamping; soft switching; zero-current commutation;
Journal_Title :
Power Electronics, IEEE Transactions on
DOI :
10.1109/TPEL.2014.2315834