Title :
On the performance of an MPC controller including a Notch filter for an AFM
Author :
Rana, M.S. ; Pota, Hemanshu R. ; Petersen, Ian R.
Author_Institution :
Sch. of Eng. & Inf. Technol., Univ. of New South Wales, Canberra, ACT, Australia
Abstract :
The imaging performance of an atomic force microscope (AFM) at high scanning speeds is limited due to the nonlinear behavior of its scanning unit; i.e., the piezoelectric tube scanner (PTS). In order to increase the imaging speed of the AFM, a model predictive control (MPC) scheme is applied in both the X and Y piezo axes of the PTS to reduce its nonlinearity effects and a modified MPC-Notch scheme is used to improve in damping of the resonant mode. In order to verify the performance improvement achieved by the proposed schemes, scanned images from them, the existing AFM proportional-integral (PI) controller, and an open-loop AFM system are compared.
Keywords :
PI control; atomic force microscopy; notch filters; open loop systems; physical instrumentation control; piezoelectric devices; predictive control; AFM proportional-integral controller; MPC controller; PTS; atomic force microscope; model predictive control scheme; modified MPC-notch scheme; notch filter; open-loop AFM system; piezoelectric tube scanner; Frequency measurement; Imaging; Kalman filters; Noise; Phase measurement; Resonant frequency; Sensors;
Conference_Titel :
Control Conference (AUCC), 2013 3rd Australian
Conference_Location :
Fremantle, WA
Print_ISBN :
978-1-4799-2497-4
DOI :
10.1109/AUCC.2013.6697321
