• DocumentCode
    664337
  • Title

    Inverted interconnect between substrate integrated waveguide and coplanar waveguide

  • Author

    Taringou, Farzaneh ; Bornemann, Jens ; Ke Wu

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Victoria, Victoria, BC, Canada
  • fYear
    2013
  • fDate
    2-7 June 2013
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    A new interconnect between substrate integrated waveguide (SIW) and coplanar waveguide (CPW) is introduced. Contrary to similar interconnects to CPW or grounded CPW (GCPW), in which the top plate of the SIW is transitioned to the center conductor of the CPW, the new design connects the bottom plate of the SIW to the center conductor of the CPW by means of a row of via holes. It is thus termed `inverted´ interconnect. A parametric analysis of the two design parameters involved determines the interconnect design which is validated by two commercially available field solvers. A back-to-back transition is prototyped and measured. Experimental results agree well with theoretical predictions and achieve a return loss of better than 16 dB over the entire 18-28 GHz range with a maximum insertion loss of 1.2 dB. The comparative values of a non-inverted back-to-back SIW-to-CPW prototype are 15 dB and 1.5 dB, respectively. Moreover, the non-inverted transition requires a larger substrate area.
  • Keywords
    coplanar waveguides; integrated circuit design; integrated circuit interconnections; substrate integrated waveguides; CPW; SIW; bottom plate; center conductor; coplanar waveguide; frequency 18 GHz to 28 GHz; interconnect design; inverted interconnect; loss 1.2 dB; parametric analysis; substrate integrated waveguide; Conductors; Coplanar waveguides; Insertion loss; Integrated circuit interconnections; Loss measurement; Prototypes; Substrates; Integrated circuit interconnections; dielectric substrates; integrated circuit measurements; wideband;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest (IMS), 2013 IEEE MTT-S International
  • Conference_Location
    Seattle, WA
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4673-6177-4
  • Type

    conf

  • DOI
    10.1109/MWSYM.2013.6697343
  • Filename
    6697343