• DocumentCode
    664356
  • Title

    Comparison of two W-band low-noise amplifier MMICs with ultra low power consumption based on 50nm InGaAs mHEMT technology

  • Author

    Thome, Fabian ; Massler, Hermann ; Wagner, Steffen ; Leuther, A. ; Kallfass, I. ; Schlechtweg, Michael ; Ambacher, Oliver

  • Author_Institution
    Fraunhofer Inst. for Appl. Solid State Phys. IAF, Freiburg, Germany
  • fYear
    2013
  • fDate
    2-7 June 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Two millimeter-wave monolithic integrated circuit (MMIC) low-noise amplifiers (LNA), operating in the frequency range between 58 and 110 GHz and 74 and 110 GHz, respectively, are presented. The W-band amplifiers employ a three-stage design in a 50nm InGaAs mHEMT technology and were optimized for minimum DC power consumption, using 2×10 and 2×5 μm transistors. For optimum bias conditions the first amplifier achieved a linear gain of more than 16.4dB and a noise figure of less than 2.8 dB over the whole W-band, whereas the second amplifier operates in the frequency range between 80 to 110 GHz with a linear gain of over 14.5 dB and a noise figure of less than 3.3 dB. The best achieved noise figure is 2.1dB and the maximum gain is about 23dB. LNA 1 yields a noise figure of 3 dB and a gain of 8.9dB at an operation frequency of 106 GHz, whilst only consuming 0.9mW of DC power.
  • Keywords
    HEMT integrated circuits; III-V semiconductors; MMIC amplifiers; gallium compounds; indium compounds; low noise amplifiers; low-power electronics; millimetre wave amplifiers; InGaAs; InGaAs mHEMT technology; MMIC low-noise amplifiers; W-band amplifiers; frequency 58 GHz to 110 GHz; frequency 74 GHz to 110 GHz; millimeter-wave monolithic integrated circuit LNA; power 0.9 mW; size 50 nm; three-stage design; ultra low power consumption; Gain; MMICs; Noise; Power demand; mHEMTs; HEMTs; MMICs; W-band; low power electronics; low-noise amplifier; noise figure;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest (IMS), 2013 IEEE MTT-S International
  • Conference_Location
    Seattle, WA
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4673-6177-4
  • Type

    conf

  • DOI
    10.1109/MWSYM.2013.6697362
  • Filename
    6697362