DocumentCode :
664376
Title :
Bond-wire engineering to improve power performance in multi-cell GaN package devices
Author :
Halder, Sebastian ; McMacken, John ; Runton, Dave
fYear :
2013
fDate :
2-7 June 2013
Firstpage :
1
Lastpage :
3
Abstract :
Power distribution across large multi-cell GaN packaged device studied through 3D EM simulation to show significant non-uniformity in output power, phase and temperature in unmatched standard parts. A simple technique by changing drain bond-wire lengths to equalize the phase front has been shown to improve the combining efficiency of the power cells which in turn improves gain and power performance by 10-15% at higher frequencies of 3.5GHz at 48V without sacrificing the low frequency response.
Keywords :
III-V semiconductors; gallium compounds; power semiconductor devices; semiconductor device models; semiconductor device packaging; wide band gap semiconductors; 3D EM simulation; bond wire engineering; drain bond wire lengths; frequency 3.5 GHz; low frequency response; multicell package devices; phase front; power cells; power distribution; power performance; voltage 48 V; Gain; Gallium nitride; Logic gates; Power distribution; Power generation; Solid modeling; Standards; GAN HEMTs; Power transistors; powerbars; semiconductor device modeling; semiconductor device packaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest (IMS), 2013 IEEE MTT-S International
Conference_Location :
Seattle, WA
ISSN :
0149-645X
Print_ISBN :
978-1-4673-6177-4
Type :
conf
DOI :
10.1109/MWSYM.2013.6697383
Filename :
6697383
Link To Document :
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