• DocumentCode
    66445
  • Title

    Electric Current-Induced Mass Flow in Very Thin Infinite Metallic Films

  • Author

    Talukder, Santanu ; Kumar, Pranaw ; Pratap, Rudra

  • Author_Institution
    Center for Nano Sci. & Eng., Indian Inst. of Sci., Bangalore, India
  • Volume
    60
  • Issue
    9
  • fYear
    2013
  • fDate
    Sept. 2013
  • Firstpage
    2877
  • Lastpage
    2883
  • Abstract
    This paper reports on the mass transport behavior of infinitely extended, continuous, and very thin metallic films under the influence of electric current. Application of direct current of high densities (> 108 A/m2) results in visible melting of thin film at only one of the electrodes, and the melt then flows towards the other electrode in a circularly symmetric fashion forming a microscale ring pattern. For the two tested thin film systems, namely Cr and Al, of thicknesses ranging from 4 to 20 nm, the above directional flow consistently occurred from cathode to anode and anode to cathode, respectively. Furthermore, application of alternating electric current results in flow of the liquid material from both the electrodes. The dependence of critical flow behavior parameters, such as flow direction, flow velocity, and evolution of the ring diameter, are experimentally determined. Analytical models based on the principles of electromigration in liquid-phase materials are developed to explain the experimental observations.
  • Keywords
    electromigration; metallic thin films; Al; Cr; anode; cathode; critical flow behavior parameter; directional flow; electric current-induced mass flow; electromigration; flow direction; flow velocity; liquid-phase material; mass transport behavior; microscale ring pattern; size 4 nm to 20 nm; thin infinite metallic film; visible melting; Electrodes; Electromigration; Liquids; Loading; Metals; Probes; Electromigration; liquid electromigration; reliability; very thin films;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2013.2273949
  • Filename
    6573327