DocumentCode :
664451
Title :
Characterizing the in-phase reflection bandwidth theoretical limit of artificial magnetic conductors with transmission line model
Author :
Yunsong Xie ; Xin Fan ; Yunpeng Chen ; Wilson, Jared D. ; Simons, Rainee N. ; Xiao, John Q.
Author_Institution :
Dept. of Phys. & Astron., Univ. of Delaware, Newark, DE, USA
fYear :
2013
fDate :
2-7 June 2013
Firstpage :
1
Lastpage :
4
Abstract :
We validate through simulation and experiment that artificial magnetic conductors (AMC´s) can be well characterized by a transmission line model. The theoretical bandwidth limit of the in-phase reflection can be expressed in terms of the effective RLC parameters from the surface patch and the properties of the substrate. It is found that the existence of effective inductive components will reduce the in-phase reflection bandwidth of the AMC. Furthermore, we propose design strategies to optimize AMC structures with an in-phase reflection bandwidth closer to the theoretical limit.
Keywords :
RLC circuits; conductors (electric); reflection; transmission lines; AMC structures; artificial magnetic conductors; effective RLC parameters; in-phase reflection bandwidth theoretical limit; inductive components; transmission line model; Antenna measurements; Bandwidth; Conductors; Impedance; Reflection; Substrates; Surface impedance; Surface impedance; transmission line matrix methods;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest (IMS), 2013 IEEE MTT-S International
Conference_Location :
Seattle, WA
ISSN :
0149-645X
Print_ISBN :
978-1-4673-6177-4
Type :
conf
DOI :
10.1109/MWSYM.2013.6697460
Filename :
6697460
Link To Document :
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