DocumentCode :
664544
Title :
An RF/microwave microfluidic sensor based on a center-gapped microstrip line for miniaturized dielectric spectroscopy
Author :
Suster, Michael A. ; Mohseni, Pedram
Author_Institution :
Electr. Eng. & Comput. Sci., Case Western Reserve Univ., Cleveland, OH, USA
fYear :
2013
fDate :
2-7 June 2013
Firstpage :
1
Lastpage :
3
Abstract :
This paper reports on the design, fabrication and testing of a microfluidic sensor as part of a miniaturized measurement platform currently under development for dielectric spectroscopy (DS) at RF/microwave frequencies. The sensor employs a microstrip line with a 50-μm gap at the center as a parallel-plate capacitive sensing element and a 3-μL PDMS microfluidic channel on top for delivering the solution-under-test (SUT). Requiring only an S21 measurement and after a 5-point calibration for a dielectric constant range of 1 to 48, sensor dielectric readings in the frequency range of 14MHz to 4GHz agree very well with bulk-solution reference measurements conducted with an Agilent dielectric probe kit. The maximum errors over the full frequency range for ethanol, ethylene glycol and ethyl acetate are -6.9%, -8.4% and -7.4%, respectively. The errors reduce to 1.7%, -4.7% and -7.1%, respectively, for frequencies above 2GHz.
Keywords :
capacitive sensors; microfluidics; microsensors; microstrip lines; microwave spectroscopy; permittivity measurement; PDMS microfluidic channel; RF microfluidic sensor; bulk solution reference measurements; center gapped microstrip line; frequency 14 MHz to 4 GHz; microwave microfluidic sensor; miniaturized dielectric spectroscopy; miniaturized measurement platform; parallel plate capacitive sensing element; Dielectrics; Frequency measurement; Microfluidics; Permittivity measurement; Spectroscopy; Transmission line measurements; Biosensor; RF/microwave sensor; dielectric spectroscopy; microfluidics; microstrip line; microsystem; miniaturized platform;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest (IMS), 2013 IEEE MTT-S International
Conference_Location :
Seattle, WA
ISSN :
0149-645X
Print_ISBN :
978-1-4673-6177-4
Type :
conf
DOI :
10.1109/MWSYM.2013.6697555
Filename :
6697555
Link To Document :
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