Title :
Frequency synthesis for high precision wideband millimeter wave radar systems using a SiGe bipolar chip
Author :
Hasenaecker, G. ; Pohl, Nils ; Musch, Thomas
Author_Institution :
Inst. of Electron. Circuits, Ruhr-Univ. Bochum, Bochum, Germany
Abstract :
The performance of frequency synthesizers with respect to bandwidth and phase noise limits the overall performance of high precision FMCW radar systems. An essential challenge of fractional-N ramp synthesizers is to combine high reference frequency and low division ratio in the loop to minimize phase noise. For an 80GHz radar system with ultra high bandwidth of 24.5 GHz we meet this challenge with a programmable frequency divider with unrivaled high input frequency. These building blocks have been implemented on a single SiGe integrated circuit. The developed phase-locked loop (PLL) includes a reverse phase downconversion mixer driven by a fixed frequency PLL to attain constant loop gain. The phase noise of the fixed frequency PLL has been measured to be -104 dBc/Hz at 20kHz offset from the center frequency of 48 GHz, which enables a phase noise of the 80GHz radar output of -93 dBc/Hz at 20 kHz offset frequency.
Keywords :
CW radar; FM radar; bipolar integrated circuits; frequency dividers; frequency synthesizers; millimetre wave radar; mixers (circuits); phase locked loops; SiGe bipolar chip; SiGe integrated circuit; fixed frequency PLL; fractional-N ramp synthesizers; frequency 20 kHz; frequency 48 GHz; frequency 80 GHz; frequency synthesis; frequency synthesizers; high precision FMCW radar systems; high precision wideband millimeter wave radar systems; phase noise limits; phase noise minimization; phase-locked loop; programmable frequency divider; reverse phase downconversion mixer; Bandwidth; Frequency conversion; Frequency measurement; Frequency synthesizers; Phase locked loops; Phase noise; Voltage-controlled oscillators; FMCW; Fractional Divider; Frequency Synthesis; Integrated Circuits; SiGe;
Conference_Titel :
Microwave Symposium Digest (IMS), 2013 IEEE MTT-S International
Conference_Location :
Seattle, WA
Print_ISBN :
978-1-4673-6177-4
DOI :
10.1109/MWSYM.2013.6697560