DocumentCode :
664584
Title :
A 75–116-GHz LNA with 23-K noise temperature at 108 GHz
Author :
Varonen, Mikko ; Reeves, R. ; Kangaslahti, Pekka ; Samoska, Lorene ; Akgiray, A. ; Cleary, K. ; Gawande, R. ; Fung, Andy ; Gaier, Todd ; Weinreb, S. ; Readhead, Anthony C. S. ; Lawrence, Charles ; Sarkozy, Stephen ; Lai, Richard
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
fYear :
2013
fDate :
2-7 June 2013
Firstpage :
1
Lastpage :
3
Abstract :
In this paper we present the design and measurement results, both on-wafer and in package, of an ultra-low-noise and wideband monolithic microwave integrated circuit (MMIC) amplifier in the frequency range of 75 to 116 GHz. The three-stage amplifier packaged in a WR10 waveguide housing and fabricated using a 35-nm InP HEMT technology achieves a record noise temperature of 23 K at 108 GHz when cryogenically cooled to 27 K. The measured gain is 22 to 27 dB for frequency range of 75 to 116 GHz. Furthermore, the amplifier utilizes four-finger devices with a total gate width of 60 μm resulting in higher output power. Therefore, we consider that this amplifier achieves state-of-the-art performance in terms of bandwidth, noise temperature, gain, and linearity so far reported for cryogenically cooled amplifiers around W-band.
Keywords :
III-V semiconductors; MMIC amplifiers; cryogenic electronics; field effect MIMIC; high electron mobility transistors; indium compounds; integrated circuit packaging; low noise amplifiers; millimetre wave amplifiers; HEMT technology; InP; LNA; MMIC amplifier; W-band; WR10 waveguide housing; cryogenically cooled amplifiers; four-finger devices; frequency 75 GHz to 116 GHz; gain 22 dB to 27 dB; noise temperature; size 35 nm; size 60 mum; temperature 23 K; temperature 27 K; three-stage amplifier; ultra-low-noise amplifier; wideband monolithic microwave integrated circuit amplifier; Cryogenics; Frequency measurement; HEMTs; MMICs; Noise; Noise measurement; InP HEMT; MMIC; cryogenic; low-noise amplifier;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest (IMS), 2013 IEEE MTT-S International
Conference_Location :
Seattle, WA
ISSN :
0149-645X
Print_ISBN :
978-1-4673-6177-4
Type :
conf
DOI :
10.1109/MWSYM.2013.6697595
Filename :
6697595
Link To Document :
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