DocumentCode
664606
Title
A transient analysis of negative refraction at the interface between two transmission-line grids
Author
Markley, Loic ; Eleftheriades, George
Author_Institution
Edward S. Rogers Sr. Dept. of Electr. & Comput. Eng., Univ. of Toronto, Toronto, ON, Canada
fYear
2013
fDate
2-7 June 2013
Firstpage
1
Lastpage
4
Abstract
In response to a few recent publications that deny the existence of negative refraction at a single interface on the grounds that it violates causality, an investigation is performed using two-dimensional transmission-line grids. Containing only passive elements and simulated using a standard circuit simulator, the transient response of an obliquely incident Gaussian beam on a negative-refractive-index material is examined. Phase velocity and group velocity (power) are both shown to refract negatively. The refracted beam front, however, is no longer parallel to the phase fronts. In order to remain causal, it must always maintain a positive angle with respect to the interface. This front is called the group front, and despite facing in a different direction, it propagates in the direction of the group velocity. The effect of adding a second interface to the simulation is also shown. In this case, the wave emerging from the negative-refractive-index slab is parallel to the incident wave.
Keywords
circuit simulation; metamaterials; passive networks; transient analysis; transient response; transmission lines; Gaussian beam; group front; group velocity; incident wave; negative refraction; negative-refractive-index material; negative-refractive-index slab; passive elements; phase velocity; refracted beam front; standard circuit simulator; transient analysis; transient response; two-dimensional transmission-line grids; Color; Dispersion; Integrated circuit modeling; Materials; Slabs; Transient analysis; Transmission lines; dispersion; group fronts; group velocity; metamaterials; negative refraction; transmission lines;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest (IMS), 2013 IEEE MTT-S International
Conference_Location
Seattle, WA
ISSN
0149-645X
Print_ISBN
978-1-4673-6177-4
Type
conf
DOI
10.1109/MWSYM.2013.6697617
Filename
6697617
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