DocumentCode :
664641
Title :
Approaches to wafer level packaging for SAW components
Author :
Pitschi, F.M. ; Bauer, Christian ; Koch, R.D. ; Wagner, K.C.
Author_Institution :
TDK Corp., Munich, Germany
fYear :
2013
fDate :
2-7 June 2013
Firstpage :
1
Lastpage :
3
Abstract :
Truly die-size wafer level packages for surface acoustic wave (SAW) devices are necessary due to stringent size, weight, and price requirements. Recent approaches are presented that feature a bottom and cap wafer both made of the same piezoelectric material. The wafers are adhesively or eutectically bonded with, respectively, polymer or copper frames acting as spacers that ensure the obligatory cavities above the acoustic structures. Variants of these basic structures allow for the integration of coils within the packages. Due to its extremely compact realization a component - consisting of a first die with the acoustic structures and a second die forming the cap that optionally includes integrated coils - demands for extensive model building and sophisticated simulation tools in order to capture its electromagnetic couplings. The complex models comprise the 3D line crossings on the die as well as the 3D interconnects between the dies. Such complex simulations have been the base for both successfully developing the packaging technologies and optimizing the performance of the concrete components. Examples of application to duplexers will be shown.
Keywords :
adhesive bonding; coils; electromagnetic coupling; integrated circuit interconnections; piezoelectric materials; surface acoustic wave devices; wafer level packaging; 3D interconnects; 3D line crossings; SAW components; SAW devices; acoustic structures; adhesive bonding; bottom wafer; cap wafer; coils; die forming; die-size wafer level packaging; electromagnetic couplings; eutectic bonding; obligatory cavities; packaging technologies; piezoelectric material; surface acoustic wave devices; Cavity resonators; Coils; Copper; Decision support systems; Packaging; Surface acoustic waves;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest (IMS), 2013 IEEE MTT-S International
Conference_Location :
Seattle, WA
ISSN :
0149-645X
Print_ISBN :
978-1-4673-6177-4
Type :
conf
DOI :
10.1109/MWSYM.2013.6697652
Filename :
6697652
Link To Document :
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