DocumentCode
664683
Title
Terahertz 7-port reflectometer for S-parameter measurements
Author
Jijun Yao ; Wah, Michael Chia Yan
Author_Institution
Inst. for Infocomm Res., Agency for Sci., Technol. & Res., Singapore, Singapore
fYear
2013
fDate
2-7 June 2013
Firstpage
1
Lastpage
4
Abstract
A new 7-port structure for terahertz reflectometer is proposed and analyzed. Our structure for 7-port reflectometer can be designed and fabricated more easily at terahertz.. as compared with traditional 6 or 7 port reflectometers and achieved near-perfect phasor distribution. Our 300 GHz reflectometer was fabricated and validated with performances with VNA.
Keywords
S-parameters; microwave reflectometry; network analysers; reflectometers; 7-port structure; 7-port terahertz reflectometer; S-parameter measurement; VNA; frequency 300 GHz; near perfect phasor distribution; Bandwidth; Couplers; Detectors; Microwave theory and techniques; Phase measurement; Ports (Computers); Scattering parameters; 7-port; S-parameter measurement; reflectometer; terahertz;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest (IMS), 2013 IEEE MTT-S International
Conference_Location
Seattle, WA
ISSN
0149-645X
Print_ISBN
978-1-4673-6177-4
Type
conf
DOI
10.1109/MWSYM.2013.6697694
Filename
6697694
Link To Document