Title :
Terahertz 7-port reflectometer for S-parameter measurements
Author :
Jijun Yao ; Wah, Michael Chia Yan
Author_Institution :
Inst. for Infocomm Res., Agency for Sci., Technol. & Res., Singapore, Singapore
Abstract :
A new 7-port structure for terahertz reflectometer is proposed and analyzed. Our structure for 7-port reflectometer can be designed and fabricated more easily at terahertz.. as compared with traditional 6 or 7 port reflectometers and achieved near-perfect phasor distribution. Our 300 GHz reflectometer was fabricated and validated with performances with VNA.
Keywords :
S-parameters; microwave reflectometry; network analysers; reflectometers; 7-port structure; 7-port terahertz reflectometer; S-parameter measurement; VNA; frequency 300 GHz; near perfect phasor distribution; Bandwidth; Couplers; Detectors; Microwave theory and techniques; Phase measurement; Ports (Computers); Scattering parameters; 7-port; S-parameter measurement; reflectometer; terahertz;
Conference_Titel :
Microwave Symposium Digest (IMS), 2013 IEEE MTT-S International
Conference_Location :
Seattle, WA
Print_ISBN :
978-1-4673-6177-4
DOI :
10.1109/MWSYM.2013.6697694
