DocumentCode :
664692
Title :
A hierarchical domain decomposition method for rigorous conductor modeling of signal integrity in multi-scale integrated circuits
Author :
Yang Shao ; Zhen Peng ; Jin-Fa Lee
Author_Institution :
ElectroScience Lab., Ohio State Univ. Columbus, Columbus, OH, USA
fYear :
2013
fDate :
2-7 June 2013
Firstpage :
1
Lastpage :
4
Abstract :
We present a hierarchical multi-solver domain decomposition method to accurately analyzing the signal integrity problems in multi-scale integrated circuits. Particularly, we discuss in detail a 3-D full wave method to model the conductor loss due to finite conductivities in metals. The proposed multi-solver non-conformal domain decomposition method follows a hierarchical domain partitioning strategy and the original problem is decomposed into non-overlapping subregions. A finite element domain decomposition method is adopted for the dielectric subregion with complex geometries and non-uniform material properties. While for the conductor subregion, a surface integral equation domain decomposition method is applied. To further improve the convergence in the DDM iterations, optimized transmission conditions are introduced to enforce the field continuities across sub-domain interfaces. Moreover, a hierarchical multi-level fast multiple method is adopted to address the low frequency issues particularly in IC applications. Rigorous numerical experiments validate the potential benefits offered by the proposed method.
Keywords :
conductors (electric); finite element analysis; integral equations; integrated circuit modelling; integrated circuit packaging; 3-D full wave method; finite element domain decomposition method; finite metal conductivities; hierarchical domain partitioning strategy; hierarchical multilevel fast multiple method; hierarchical multisolver domain decomposition method; multiscale integrated circuits; rigorous conductor modeling; signal integrity; surface integral equation domain decomposition method; Computational modeling; Conductors; Dielectrics; Integral equations; Integrated circuit modeling; Microstrip; Signal integrity; conductor loss; generalized combined field integral equation; multi-solver domain decomposition method; surface integral equation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest (IMS), 2013 IEEE MTT-S International
Conference_Location :
Seattle, WA
ISSN :
0149-645X
Print_ISBN :
978-1-4673-6177-4
Type :
conf
DOI :
10.1109/MWSYM.2013.6697703
Filename :
6697703
Link To Document :
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