• DocumentCode
    66472
  • Title

    Bayesian Control Loop Diagnosis by Combining Historical Data and Process Knowledge of Fault Signatures

  • Author

    Namaki-Shoushtari, Omid ; Biao Huang

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Alberta, Edmonton, AB, Canada
  • Volume
    62
  • Issue
    6
  • fYear
    2015
  • fDate
    Jun-15
  • Firstpage
    3696
  • Lastpage
    3704
  • Abstract
    Many performance monitoring algorithms (or monitors) have been developed to assess control performance and detect problems with specific components; however, these algorithms monitor single components as stand-alone experts and can be influenced by other problems that they were not meant to detect. Thus, the occurrence of a problem can lead to flood of abnormal monitor outputs and alarms which can be difficult to interpret. This work focuses on how to combine information from the many different monitoring algorithms and some of process knowledge in order to obtain a more reliable diagnosis. While traditional statistical or data-based methods need data from all abnormal cases that they should diagnose/isolate, this work focuses on how to improve the Bayesian control loop diagnosis by integrating process knowledge and training data when some of the abnormality data are sparse or not available in historical database. Simulation of the proposed Bayesian diagnostic system on the Tennessee Eastman challenge problem is presented. It is demonstrated that the diagnosis is possible even when there are no training data (or only few samples) from some abnormalities.
  • Keywords
    Bayes methods; fault diagnosis; process control; Bayesian control loop diagnosis; Bayesian diagnostic system; Tennessee Eastman challenge problem; abnormal monitor outputs; alarms; assess control performance; data-based methods; fault signatures; historical data; performance monitoring algorithms; process knowledge; statistical methods; Bayes methods; Materials; Monitoring; Process control; Sensors; Training data; Vectors; Bayesian method; control loop diagnosis; performance assessment; process control;
  • fLanguage
    English
  • Journal_Title
    Industrial Electronics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0046
  • Type

    jour

  • DOI
    10.1109/TIE.2014.2375253
  • Filename
    6971178