• DocumentCode
    664747
  • Title

    High-power microwave gas discharge in high-Q evanescent-mode cavity resonators and its instantaneous/long-term effects

  • Author

    Chen, K. ; Semnani, Abbas ; Peroulis, Dimitrios

  • Author_Institution
    Birck Nano Technol. Center, Purdue Univ., West Lafayette, IN, USA
  • fYear
    2013
  • fDate
    2-7 June 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper presents the first experimental and theoretical investigation of high-power RF gas discharge as applied to RF front-end filters with critical air gaps in the 10s of μm. Specifically, a strongly-coupled high-Q evanescent-mode resonant cavity is utilized as a vehicle in this study. This cavity tends to concentrate the resonant electric field in a small volume between its loading post and top wall. Both experiments conducted up to 45.3 dBm at 6.5 GHz and molecular-dynamics-based modeling suggest that, as the input power is increased, gas ionization leads to increasing gas discharge inside this volume. In addition to the measured RF data, surface analysis of the cavity post and top wall lead to the same conclusion. Besides the observed instantaneous effects on the resonator´s RF performance, the impact of gas discharge in its long-term performance and potential failure is analyzed.
  • Keywords
    cavity resonator filters; high-frequency discharges; ionisation; radiofrequency filters; RF data; RF front-end filters; cavity resonators; frequency 6.5 GHz; gas ionization; high-Q evanescent-mode; high-power microwave gas discharge; instantaneous effects; long-term effects; molecular dynamics; resonant electric field; surface analysis; Cavity resonators; Discharges (electric); Ionization; Plasmas; Radio frequency; Resonant frequency; Surface discharges; Evanescent-mode cavity; filter; gas discharge; high power; ionization; plasma;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest (IMS), 2013 IEEE MTT-S International
  • Conference_Location
    Seattle, WA
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4673-6177-4
  • Type

    conf

  • DOI
    10.1109/MWSYM.2013.6697759
  • Filename
    6697759