Title :
Behavioral modeling of outphasing amplifiers considering memory effects
Author :
Landin, Per N. ; Eriksson, Thomas ; Fritzin, Jonas ; Alvandpour, Atila
Author_Institution :
Univ. of Gavle, Gavle, Sweden
Abstract :
This paper proposes a behavioral model structure for outphasing amplifiers. The model performance is evaluated on a class-D CMOS outphasing amplifier and compared with two models found in the literature. The proposed model structure also allows the use of memory in a parallel Hammerstein-like setting. The proposed models show improvements in adjacent channel error power ratio (ACEPR) of approximately 5 dB in addition to being linear in the parameters. The lower model errors enable the use and design of improved predistorters taking frequency dependency (memory effects) in outphasing amplifiers into account.
Keywords :
CMOS analogue integrated circuits; amplifiers; integrated circuit modelling; nonlinear distortion; ACEPR; adjacent channel error power ratio; behavioral modeling; class-D CMOS outphasing amplifier; frequency dependency; memory effects; model performance; nonlinear distortion; parallel Hammerstein-like setting; predistorters; Bandwidth; CMOS integrated circuits; Nonlinear distortion; Phase distortion; Predistortion; Radio frequency; Semiconductor device modeling; CMOS; Power amplifier; nonlinear distortion; predistortion;
Conference_Titel :
Microwave Symposium Digest (IMS), 2013 IEEE MTT-S International
Conference_Location :
Seattle, WA
Print_ISBN :
978-1-4673-6177-4
DOI :
10.1109/MWSYM.2013.6697764