DocumentCode
664771
Title
Temperature sensitivity of large digital-beamforming multistatic mm-wave imaging systems
Author
Schiessl, A. ; Ahmed, S. Shahnawaz ; Genghammer, Andreas ; Schmidt, Lorenz-Peter
Author_Institution
Rohde & Schwarz GmbH & Co. KG, Munich, Germany
fYear
2013
fDate
2-7 June 2013
Firstpage
1
Lastpage
3
Abstract
Large multistatic mm-wave imaging systems have recently been developed and proved to be efficient for security applications. This work analyzes the effects caused by temperature changes on the imaging performance of a state-of-the-art system. The temperature dependent phase drift of a single measurement channel is characterized. A linearized model for the phase drifts in the RF channels is thus derived. This model is applied to simulate for systematic phase drifts in the recorded raw data of the imaging system at different temperature profiles. Afterwards, images are reconstructed using modified raw data. Accordingly, the degradation in the imaging performance due to temperature changes is presented in terms of image quality and the associated point spread functions.
Keywords
array signal processing; image reconstruction; millimetre wave imaging; optical transfer function; temperature; image quality; image reconstruction; large digital beamforming imaging systems; multistatic millimeter wave imaging systems; phase drift linearized model; point spread function; single measurement channel; systematic phase drift; temperature dependent phase drift; temperature sensitivity; Image reconstruction; Microwave imaging; Phase measurement; Radio frequency; Temperature measurement; Temperature sensors; chip-on-board; microwave imaging; millimeter wave technology; multichip modules; temperature dependence;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest (IMS), 2013 IEEE MTT-S International
Conference_Location
Seattle, WA
ISSN
0149-645X
Print_ISBN
978-1-4673-6177-4
Type
conf
DOI
10.1109/MWSYM.2013.6697783
Filename
6697783
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