DocumentCode :
665280
Title :
Coupling experimental and modelling results for device failure anticipation
Author :
Ecoiffier, Diane ; Vernhes, Pierre
Author_Institution :
Insidix, Seyssins, France
fYear :
2013
fDate :
9-12 Sept. 2013
Firstpage :
1
Lastpage :
4
Abstract :
Saving time and money is a key and nowadays major issue in all fields and structures (whatever industry or lab). However, component reliability should not suffer from shorter development time ! An emerging approach to decrease model development time and errors is to use real measurements data to implement the models. For several types of application (electronic, power, adhesive), a methodology was developed to determine relevant mechanical properties of interfaces for improving stress and deformation prediction. Thus, the approach can be applied not only to samples built in laboratories but also to commercial assemblies coming from massive manufacturing. In this paper, we propose several examples of successful combination of measurements and modeling for adhesive development and for power devices. The measurements are done with TDM, the system developed by Insidix to characterize warpage variation during reflow or cycle.
Keywords :
acoustic microscopy; deformation; failure analysis; integrated circuit packaging; three-dimensional integrated circuits; Insidix; component reliability; deformation prediction; device failure anticipation; massive manufacturing; measurements data; model development time; power devices; reflow; warpage variation; Assembly; Materials; Predictive models; Stress; Surfaces; Temperature measurement; Time division multiplexing; FEM simulation; Thermo-mechanical behaviour; Warpage measurements; lifetime prediction; material models;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microelectronics Packaging Conference (EMPC) , 2013 European
Conference_Location :
Grenoble
Type :
conf
Filename :
6698597
Link To Document :
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