DocumentCode
665280
Title
Coupling experimental and modelling results for device failure anticipation
Author
Ecoiffier, Diane ; Vernhes, Pierre
Author_Institution
Insidix, Seyssins, France
fYear
2013
fDate
9-12 Sept. 2013
Firstpage
1
Lastpage
4
Abstract
Saving time and money is a key and nowadays major issue in all fields and structures (whatever industry or lab). However, component reliability should not suffer from shorter development time ! An emerging approach to decrease model development time and errors is to use real measurements data to implement the models. For several types of application (electronic, power, adhesive), a methodology was developed to determine relevant mechanical properties of interfaces for improving stress and deformation prediction. Thus, the approach can be applied not only to samples built in laboratories but also to commercial assemblies coming from massive manufacturing. In this paper, we propose several examples of successful combination of measurements and modeling for adhesive development and for power devices. The measurements are done with TDM, the system developed by Insidix to characterize warpage variation during reflow or cycle.
Keywords
acoustic microscopy; deformation; failure analysis; integrated circuit packaging; three-dimensional integrated circuits; Insidix; component reliability; deformation prediction; device failure anticipation; massive manufacturing; measurements data; model development time; power devices; reflow; warpage variation; Assembly; Materials; Predictive models; Stress; Surfaces; Temperature measurement; Time division multiplexing; FEM simulation; Thermo-mechanical behaviour; Warpage measurements; lifetime prediction; material models;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronics Packaging Conference (EMPC) , 2013 European
Conference_Location
Grenoble
Type
conf
Filename
6698597
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