Title :
Robust and Adaptive Estimation of State of Charge for Lithium-Ion Batteries
Author :
Caiping Zhang ; Le Yi Wang ; Xue Li ; Wen Chen ; Yin, George G. ; Jiuchun Jiang
Author_Institution :
Nat. Active Distrib. Network Technol. Res. Center, Beijing Jiaotong Univ., Beijing, China
Abstract :
The reliable operation of battery management systems depends critically on the accurate estimation of the state of charge (SOC) and characterizing parameters of a battery system. SOC estimation employs models that must be robust against variations in battery cell electrochemical features, aging, and operating conditions. This paper reveals that commonly used SOC estimation schemes are fundamentally flawed in providing the robustness of SOC estimation against model uncertainties. Parameter estimation methodologies and adaptive SOC estimation design are introduced in this paper to enhance SOC estimation accuracy and robustness. By a scrutiny of the impact of parameter variations on SOC estimation accuracy, the SOC-open-circuit-voltage mapping is identified to be the most critical function that must be accurately established. Identification algorithms are introduced, and their convergence properties are established. The integration of the identification algorithms and SOC estimation schemes lead to an adaptive SOC estimation framework that is superior over the existing methods in providing much improved accuracy and robustness. Experimental studies are conducted to validate the algorithms.
Keywords :
ageing; battery management systems; secondary cells; SOC estimation; adaptive estimation; aging; battery cell electrochemical features; battery management systems; battery system; lithium-ion batteries; operating conditions; parameter estimation methodologies; reliable operation; state of charge estimation; Accuracy; Adaptation models; Batteries; Estimation; Mathematical model; Robustness; System-on-chip; Adaption; Lithium-ion battery model; SOC estimation; adaption; lithium-ion battery model; robustness; state of charge (SOC) estimation; system identification;
Journal_Title :
Industrial Electronics, IEEE Transactions on
DOI :
10.1109/TIE.2015.2403796