• DocumentCode
    665381
  • Title

    Method for locating of single-phase-to-ground faults in ungrounded distribution systems

  • Author

    Hongbo Sun ; Nikovski, Daniel ; Takano, Takeshi ; Kojima, Yasuhiro ; Ohno, Tetsufumi

  • Author_Institution
    Mitsubishi Electr. Res. Labs., Cambridge, MA, USA
  • fYear
    2013
  • fDate
    10-13 Nov. 2013
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    This paper proposes a new method for determining locations of single-phase-to-ground faults in ungrounded distribution system using pre-fault and during-fault fundamental-frequency measurements. The pre-fault measurements along with the load profiles are used to determine load demands for each individual load in a feeder section. The during-fault measurements are used to determine possible faulted area and location. The faulted feeder and faulted feeder section are first determined based on the reactive power factors of residual powers determined for the feeder breakers and switches with sensors. The line segments in the faulted feeder section are then tested for a sign change of phase-to-ground voltage on the fault phase to determine the faulted line segment. At last, the location of the fault is determined by finding a location along the faulted line segment having a zero phase-to-ground voltage on the faulted phase. Numerical examples are given to demonstrate the effectiveness of proposed method.
  • Keywords
    fault location; power distribution faults; during-fault fundamental-frequency measurements; faulted feeder section; faulted line segment; feeder breakers; load demands; load profiles; phase-to-ground voltage; pre-fault measurements; reactive power factors; residual powers; single-phase-to-ground faults; ungrounded distribution systems; zero phase-to-ground voltage; Asia; Decision support systems; Distribution line; distribution system; fault location; single-phase-to-ground fault; ungrounded;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Innovative Smart Grid Technologies - Asia (ISGT Asia), 2013 IEEE
  • Conference_Location
    Bangalore
  • Print_ISBN
    978-1-4799-1346-6
  • Type

    conf

  • DOI
    10.1109/ISGT-Asia.2013.6698707
  • Filename
    6698707