DocumentCode :
665416
Title :
A novel grading scheme for loads to optimize load shedding using genetic algorithm in a Smart Grid environment
Author :
Rao, K. Uma ; Bhat, Satyaram Harihara ; Ganeshprasad, G.G. ; Jayaprakash, G. ; Pillappa, Selvamani N.
Author_Institution :
Electr. & Electron. Dept, R.V. Coll. of Eng., Bangalore, India
fYear :
2013
fDate :
10-13 Nov. 2013
Firstpage :
1
Lastpage :
6
Abstract :
In developing countries, a large growth in power demand necessitates the efficient distribution of available power. Whenever power demand is more than the power generation load shedding is carried out. Under the current scheme, load shedding is done by disconnecting an entire feeder, employing `Round robin´ technique. In most cases, this method fails to shed exact amount of load resulting in either over-shedding or under-shedding. Further, load shedding is done regardless of the type of the load connected to a feeder. This Paper proposes a novel grading scheme for loads to minimize the impact of load shedding by taking revenue loss and social factors into consideration. The genetic algorithm developed minimizes the error between the amount of load to be shed and the actual load shed, simultaneously optimizing the overall impact of load shedding. The algorithm is developed for a smart grid environment, assuming a two way communication between the consumer and the utility is present. The algorithm is tested on a sample system comprising practical feeder data.
Keywords :
genetic algorithms; load shedding; smart power grids; genetic algorithm; grading scheme; power generation load shedding; revenue loss; round robin technique; smart grid environment; social factors; Biological cells; Companies; Genetic algorithms; Optimization; Power demand; Power distribution; Smart grids; Genetic algorithm (GA); Grading of loads; Intelligent load shedding (ILS); Load shedding; Optimization; Smart grid;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Innovative Smart Grid Technologies - Asia (ISGT Asia), 2013 IEEE
Conference_Location :
Bangalore
Print_ISBN :
978-1-4799-1346-6
Type :
conf
DOI :
10.1109/ISGT-Asia.2013.6698742
Filename :
6698742
Link To Document :
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