DocumentCode :
665903
Title :
Optimising the dynamic performance of an all-wide-bandgap cascode switch
Author :
Garsed, P.J. ; McMahon, Richard A.
Author_Institution :
Dept. of Eng., Univ. of Cambridge, Cambridge, UK
fYear :
2013
fDate :
10-13 Nov. 2013
Firstpage :
1112
Lastpage :
1117
Abstract :
A SPICE simulation model of a novel cascode switch that combines a high voltage normally-on silicon carbide (SiC) junction field effect transistor (JFET) with a low voltage enhancement-mode gallium nitride field effect transistor (eGaN FET) has been developed, with the aim of optimising cascode switching performance. The effect of gate resistance on stability and switching losses is investigated and optimum values chosen. The effects of stray inductance on cascode switching performance are considered and the benefits of low inductance packaging discussed. The use of a positive JFET gate bias in a cascode switch is shown to reduce switching losses as well as reducing on-state losses. The findings of the simulation are used to produce a list of priorities for the design and layout of wide-bandgap cascode switches, relevant to both SiC and GaN high voltage devices.
Keywords :
SPICE; gallium compounds; junction gate field effect transistors; GaN; SPICE simulation model; all-wide-bandgap cascode switch; dynamic performance optimization; gate resistance; junction field effect transistor; low voltage enhancement-mode gallium nitride field effect transistor; positive JFET gate bias; silicon carbide; stray inductance; switching losses; Inductance; JFETs; Logic gates; Silicon carbide; Stability analysis; Switches; Circuit simulation; Gallium nitride; SPICE; Silicon carbide; Wide band gap semiconductors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics Society, IECON 2013 - 39th Annual Conference of the IEEE
Conference_Location :
Vienna
ISSN :
1553-572X
Type :
conf
DOI :
10.1109/IECON.2013.6699288
Filename :
6699288
Link To Document :
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